| Customization: | Available |
|---|---|
| After-sales Service: | Install Guidance |
| Warranty: | 5 Years |
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During the detection process, it does not directly contact the object under test, so it will not cause physical damage or interference to the object under test, maximizing the integrity and original performance of the tested components. For example, in the detection of photovoltaic modules, it will not scratch the surface of photovoltaic cells due to contact. It is very suitable for the detection of some electronic devices with high requirements for surface quality.
This detection method can also reduce the test errors caused by contact, making the detection results more accurate and reliable and truly reflecting the internal condition of the object under test.
| Product parameter | Data |
| Shooting Mode | Direct Scanning Method (Modules front facing down, non-lifting type)Camera is fixed, component is moved for shooting |
| Application Type | Before Lamination/After Lamination |
| Modules Transfer Method | Module is transferred with the long side facing forward (transverse transfer) |
| No. of Main Busbars | Main Busbar Compatibility:10-20BB |
| Modules Placement Method | Flat |
| Transfer Module Table Height | 950mm (±50mm) |
| Modules Size | Length 1640-2300mm, Width 950-1300mm Regular/Double Glass + Half-cell (156-159 cells) |
| Test Time | <22 s/pcs (shoot first, then judge) |
| Camera Type | Non-cooling type industrial camera, with a 950nm filter added to the lens |
Beijing X-Solar Energy Co., Ltd. was found in 2020, and headquartered in Beijing. It's a science and technology innovative energy enterprises with the main business of future cell R&D, flexible photovoltaic modules, building photovoltaic module production, high-end equipment manufacturing, production line delivery, and AI-CITY wisdom energy management services.
In July 2023, the company's first demonstration factory, Jiangsu X-Solar Green-building Technology Co., Ltd., was established in Jiangyin CNBM Jetion Industrial Park. Meanwhile, Jiangsu YuanTeng FengSheng Intelligent Manufacturing Technology Co., Ltd., a wholly-owned equipment company of the company, delivered the world's first "three-in-one" automatic production line for Jiangyin base. The production line can be compatible with the production of three categories: X-Solar Light shadow series (flexible PV modules), X-Solar Light rhyme series (building PVtile modules), X-Solar Light Curtain series (building PV wall modules), and customized products. X-Solar PV series products have the advantages of integrating architectural aesthetics, complying with design specifications and creating energy value, which have been widely recognized and praised by customers in domestic and overseas.
In 2024, the company has added two regional centers in Shanghai and Guangzhou of China, and set up the Hong Kong X-Solar Future Energy Research Institute, and overseas sales companies in Australia, Italy, Germany, Saudi Arabia and Argentina. The company has launched a global layout to provide sustainable energy products and services to many countries, and has contributed to the "carbon neutrality and carbon peak".
I. Questions about the principle
Question: What is the working principle of the EL tester?
Answer: The EL tester mainly works based on the principle of electroluminescence. When a forward bias voltage is applied to the tested photovoltaic modules, semiconductor devices, etc., the recombination of carriers inside them will release energy in the form of light. The EL tester captures the emitted light through high-sensitivity imaging devices such as cameras, and then analyzes whether there are defects inside the tested objects and whether the structure is normal according to the distribution and intensity of the light.
Question: How does it detect internal defects?
Answer: It relies on detecting the uniformity and intensity changes of the light signals generated by electroluminescence of the objects. For example, when a normal solar cell emits light under power supply, the overall light intensity distribution is relatively uniform. If there are hidden cracks, false soldering and other defects, the light intensity at the defect positions will become weaker or there will be abnormal dark areas. The EL tester can capture these changes in light signals and thus detect the defects.
II. Questions about application scenarios
Question: In which fields are EL testers usually used?
Answer: They are mainly applied in the photovoltaic industry to conduct quality inspections on solar cell modules and check for problems such as hidden cracks, fragments, and broken grids. They are also used in the semiconductor industry to detect the integrity of the internal structure of semiconductor chips and other devices, as well as the electron injection efficiency. Meanwhile, they are also used in the inspection of LED lighting products to check whether there are defective solder joints and other defects in LED chips.
Question: What can the EL tester be used for at the photovoltaic power station site?
Answer: At the photovoltaic power station site, a portable EL tester can be used to quickly detect the installed photovoltaic modules, check for faults such as hidden cracks and cell desoldering that may occur during transportation, installation or after long-term use, timely identify the faulty modules and arrange for maintenance or replacement to ensure the power generation efficiency and stable operation of the power station.
III. Questions about detection accuracy
Question: How high is the detection accuracy of the EL tester?
Answer: It can detect tiny hidden cracks at the micrometer level and very subtle false soldering and other defects. Some internal structural flaws that are difficult to be found by the naked eye or even by conventional detection means can be detected through the high-resolution imaging of the EL tester combined with precise light signal analysis algorithms. Its accuracy is sufficient to meet the requirements of most photovoltaic, semiconductor and other related industries for component quality control.
Question: How to ensure the stability of the detection accuracy?
Answer: On the one hand, the optical imaging system of the tester should be calibrated regularly to ensure that cameras and other equipment can accurately capture light signals. On the other hand, the testing environment should be kept relatively stable, such as light conditions, temperature and humidity. At the same time, the instrument should be operated in accordance with standard specifications, and the internal data processing algorithms should be updated and optimized regularly. All these help maintain the stability of the detection accuracy.
IV. Questions about operation and use
Question: Is the operation of the EL tester complicated?
Answer: The operation of most EL testers is relatively simple. There is an intuitive operation interface. Operators only need to set corresponding basic test parameters such as voltage and current according to the type and specification of the tested object, and then start the test. The instrument can automatically conduct the test and generate test images and results. Some portable ones can even start the testing process with just one click.
Question: What should be paid attention to when using the EL tester for the first time?
Answer: When using it for the first time, carefully read the user manual to understand the basic functions of the instrument and the functions of each component. Do a good job in the installation and commissioning of the instrument, such as connecting the power cord and data cable to ensure normal communication and power supply. Also, perform simple initialization settings for the instrument, such as setting the language and image display mode. It is best to use standard test samples for testing practice first to familiarize yourself with the operation process and result interpretation methods.
V. Questions about maintenance
Question: How to maintain the EL tester on a daily basis?
Answer: Keep the surface of the instrument clean on a daily basis to avoid dust and other substances from entering the optical imaging system and affecting the detection effect. Regularly check whether the cables of the instrument are damaged and whether the connectors are loose. Use professional cleaning tools to wipe and clean the lens of the imaging system in the correct way. Also, regularly check the software version of the instrument and update and upgrade it in time to obtain better performance and function optimization.
Question: How to troubleshoot when the instrument fails?
Answer: First, check whether there is an error message prompt on the instrument, and judge the general direction of the fault according to the prompt. For example, if it prompts a power failure, then check whether the power cord and power adapter are working normally. If there is a problem with imaging, check the camera lens, the image transmission line and the relevant image acquisition software settings. If the software runs abnormally, try restarting the instrument and the software. If the problem still cannot be solved, contact the after-sales technical personnel of the manufacturer for further troubleshooting and repair.
VI. Questions about the interpretation of test results
Question: How to understand the test images generated by the EL tester?
Answer: Under normal circumstances, the light intensity distribution in the image is uniform, and the color and brightness are relatively consistent. If there are darker areas, striped or blocky abnormal light and shadow, it may indicate that there are defects at the corresponding positions. For example, dark lines may indicate hidden cracks, and local dark blocks may indicate false soldering or cell damage. At the same time, combine the relevant labels and test data given by the instrument to comprehensively judge the type and severity of the defects.
Question: What do the various parameters in the test results represent?
Answer: The light intensity value reflects the light emission intensity at the corresponding position. The light intensity uniformity parameter reflects the uniformity of carrier recombination and light emission inside the tested object. The closer the value is to 1, the more uniform it is. There are also parameters such as contrast that can help judge the difference between the defective area and the normal area. Different parameters help analyze the quality status of the tested object from different aspects.
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